Mycological Examination of Microscopic Fungi Images with Deep Learning and Gradient Weighted Class Activation Mapping Visualization

Md. Safirur Rashid, Md. Samin Morshed, Muhammad Usama Islam, Sami Rashid, Asif Mahmud, Ashraful Islam

IEEE 2024 International Advances in Science & Engineering Technology (ASET) Multi-Conferences

IEEE, pp. 01-08