Conference Paper2021

A novel disaster image data-set and characteristics analysis using attention model

Fahim Faisal Niloy, Abu Bakar Siddik Nayem, Anis Sarker, Ovi Paul, M Ashraful Amin, Amin Ahsan Ali, Moinul Islam Zaber, AKM Mahbubur Rahman, others

2020 25th International Conference on Pattern Recognition (ICPR)

IEEE, pp. 6116–6122